Martin Ritter
  • M-26
    Eißendorfer Straße 42
    21073 Hamburg
    Deutschland
  • Tel.: +49 (0) 40 - 428 78 3543
Download (.pdf)
Download (.pdf)
Download (.pdf)
Download (.pdf)
Abstract We introduce the application of a new 3D calibration method for the calibration of scanning probe microscopes (SPM) in order to be able to obtain faster and better quantitative topography measurements for the determination of... more
Abstract We introduce the application of a new 3D calibration method for the calibration of scanning probe microscopes (SPM) in order to be able to obtain faster and better quantitative topography measurements for the determination of technical, dimensional and geometrical surface ...
Download (.pdf)
Download (.pdf)
Download (.pdf)
Download (.pdf)
Academia © 2017